Surekha S. Jadhav, Amit A. Bagade, Tukaram J. Shinde, Kesu Y. Rajpure,
Volume 19, Issue 1 (3-2022)
Abstract
In present work Ni0.7Cd0.3NdxFe2-xO4 ferrite samples (0≤x≤0.03) were prepared by using oxalate co-precipitation technique. The different characterization techniques were achieved using X-ray diffraction (XRD), FT-infrared (FTIR) spectroscopy, scanning electron microscopy (SEM), DC electrical resistivity and dielectric measurements. The crystallographic parameters such as crystal structure, crystallite size, lattice constant, unit cell volume and theoretical density have been systematically analysed. The XRD and FT-IR measurements confirmed the formation of single phase spinel ferrite structure. The cation distribution among the octahedral and tetrahedral sites has been proposed on the basis of analysis of XRD patterns by employing Rietveld refinement analysis. The samples exist as a mixed type spinel with cubic structure. The DC electrical resistivity confirms the semiconducting behaviour and the Curie temperature decreases with increase in Nd3+ content. The dielectric constant and loss tangent decreases with frequency and higher frequencies remain constant, which shows the usual dielectric dispersion due to space charge polarization. The AC conductivity reveals that the small type polarons responsible for conduction process.
